关键词: MCU, 可测性设计, 资源划分技术, MBIST

Abstract: Based on the advantages of ATE external test and MBIST internal test, a DFT design methods combined the test resource partition (TRP) technology and port reuse technology, was presented in this paper for the sake of reducing test cost and improving test efficiency. The SCAN chains of digital logical and test modes of analog IPs were designed based on ATE external test. What’s more, the MBIST circuit for memory testing was devised based on MBIST internal test. Besides, a universal testing interface supporting standard SPI protocol was designed to enhance efficiency of testing and downloading. In order to optimize the whole design, a management module of test modes was proposed, which actualized the testing for multi-IPs at the same time. The proposed DFT has been implemented in an actual wafer.

Key words: MCU, DFT, TRP, MBIST