中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2020, Vol. 20 ›› Issue (12): 120201 . doi: 10.16257/j.cnki.1681-1070.2020.1202

• 封装、组装与测试 • 上一篇    下一篇

DDR3堆叠键合组件的信号完整性分析与优化

曾燕萍1;张景辉1;王梦雅1;孙晓冬1;曹春雨2   

  1. 1.中科芯集成电路有限公司,江苏 无锡 214072;2.贵州航天电子科技有限公司,贵阳 550009
  • 收稿日期:2020-06-18 发布日期:2020-07-15
  • 作者简介:曾燕萍(1987—),女,福建上杭人,博士,工程师,主要从事三维集成系统级设计和仿真技术方面的研究工作。

Signal Integrity Analysis and Optimization ofDDR3 Stacked Bonding Module

ZENG Yanping1, ZHANG Jinghui1, WANG Mengya1, SUN Xiaodong1, CAO Chunyu2   

  1. 1. China Key System & Integrated Circuit Co., Ltd., Wuxi 214072, China;2.Guizhou Aerospace Electronic Technology Co., Ltd., Guiyang 550009, China
  • Received:2020-06-18 Published:2020-07-15

摘要: 对一种DDR3芯片堆叠键合的内存组件的封装和基板设计进行信号完整性分析和优化。采用在等效电路模型上进行参数扫描的方法,对基板DDR3传输线的分段阻抗和延时进行参数优化。结果表明,优化阻抗和延时的设计可使信号眼高增加,从而改善信号质量,其原因与容性负载补偿有关。从信号波形眼图和时序分析结果可知,该设计符合JEDEC标准。

关键词: 内存组件, DDR3, 芯片堆叠, 信号完整性, 阻抗

Abstract: Signal integrity analysis and optimization were performed on the packaging and substrate design of a DDR3 die-stacking bonding memory module. The sectional line impedance and delay parameters are scanned on the equivalent circuit model for DDR3 transmission line. The results show that the optimized impedance and delay settings increase the signal eye height and therefore improve the signal quality, which is attributed to the capacitive load compensation. According to the signal eye diagram and the timing analysis results, the design conforms to JEDEC standard.

Key words: memorymodule, DDR3, die-stacking, signalintegrity, impedance

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