中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2022, Vol. 22 ›› Issue (4): 040402 . doi: 10.16257/j.cnki.1681-1070.2022.0406

• 材料、器件与工艺 • 上一篇    下一篇

限幅低噪声放大器增益下降失效分析

贾玉伟;魏志宇;冀乃一   

  1. 中国电子科技集团公司第十三研究所,石家庄 050051
  • 收稿日期:2021-07-05 出版日期:2022-04-25 发布日期:2021-10-25
  • 作者简介:贾玉伟(1982—),男,河北昌黎人,硕士,高级工程师,主要从事微波混合集成电路的研究开发工作。

Failure Analysis on Gain Decrease of a Limiter Low NoiseAmplifier

JIA Yuwei, WEI Zhiyu, JI Naiyi   

  1. The 13th Research Institute,CETC,Shijiazhuang 050051, China
  • Received:2021-07-05 Online:2022-04-25 Published:2021-10-25

摘要: 摘要限幅低噪声放大器(Low Noise Amplifier,LNA)是微波收发组件中的关键部件,用于对接收的射频信号进行放大。接收增益是限幅LNA的关键指标,增益下降可导致微波收发组件功能失效。综合采用外观检查、万用表测量、X光检查、扫描电子显微镜(Scanning Electron Microscope,SEM)等分析手段对某型限幅LNA增益下降的原因进行了分析,确定了故障失效的原因。结果表明,增益下降是由于工艺装配过程PIN二极管芯片与管壳安全间距不足导致。研究结果对类似产品的生产装配、检测检验、失效分析有一定的参考意义。

关键词: 限幅低噪声放大器, 增益下降, 故障定位, 安全间距, 失效分析

Abstract: The limiter low noise amplifier (LNA), which is used to amplify the received radio frequency signal, is the key component of the microwave transceiver module. The receiving gain is the key parameter of the limiter LNA, and the decrease of the gain can cause the function failure of the transceiver module. Appearance inspection, multimeter measure, X-ray inspection, scanning electron microscope (SEM), and other analysis methods are used to analyze the reason of gain decrease of a limiter LNA, and the cause of the failure is determined. The results show that the gain decrease is caused by the insufficient safe distance between the PIN diode chip and the shell during the process assembly. The research result has certain reference significance for the production and assembly, inspection and failure analysis of similar products.

Key words: limiterlownoiseamplifier, gainreduction, faultlocalization, safedistance, failureanalysis

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