基于0.18 μm加固工艺的抗辐射单元库开发
姚进;左玲玲;周晓彬;刘谆;周昕杰
Radiation HardenedLibrary Development Based on 0.18μmCMOS Radiation-Hardening Process
YAO Jin, ZUO Linlin, ZHOU Xiaobin, LIU Zhun, ZHOU Xinjie
电子与封装
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2021, (8): 80303
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DOI: 10.16257/j.cnki.1681-1070.2021.0817
