基于亿门级UltraScale+架构FPGA的单粒子效应测试方法
谢文虎;郑天池;季振凯;杨茂林
Single Event Effect Testing Method Based on Billion-GateUltraScale+Architecture FPGA
XIE Wenhu, ZHENG Tianchi, JI Zhenkai, YANG Maolin
电子与封装
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2022, (7): 70202
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DOI: 10.16257/j.cnki.1681-1070.2022.0706
