辐照源对LVMOS器件总剂量辐射电离特性的影响*
陶伟;刘国柱;宋思德;魏轶聃;赵伟
Influence of IrradiationSource on Total Ionizing Dose Characteristics of LVMOS Devices
TAO Wei, LIU Guozhu, SONG Side, WEI Yidan, ZHAO Wei
电子与封装
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2022, (7): 70405
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DOI: 10.16257/j.cnki.1681-1070.2022.0715
