探卡对功率器件导通压降测试的影响
李乐乐;肖海波;张超;王贤元;潘昭海;刘启军
Influence of Probe Card on the Test of Conduction Voltage Drop of Power Devices
LI Lele, XIAO Haibo, ZHANG Chao, WANG Xianyuan, PAN Zhaohai, LIU Qijun
电子与封装
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2023, (6): 60202
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DOI: 10.16257/j.cnki.1681-1070.2023.0076
