抗辐射0.18 μm NMOS器件热载流子效应研究
谢儒彬，张庆东，纪旭明，吴建伟，洪根深
Studies of Hot-Carrier Injection Effect in 0.18 μm Radiation-hardened NMOS Transistors
XIE Rubin,ZHANG Qingdong,JI Xuming,WU Jianwei,HONG Genshen
电子与封装
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2017, (4): 30
-33
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DOI: 10.16257/j.cnki.1681-1070.2017.0049
