MOSFET器件质量与可靠性的互补表征体系研究

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张阳;王党会;郑俊娜

Study of Complementary Characteristic Systemsfor the Quality and Reliability of MOSFET Devices

ZHANG Yang, WANG Danghui, ZHENG Junna

电子与封装 . 2021, (11): 110405 - . DOI: 10.16257/j.cnki.1681-1070.2021.1113