关键词: 反熔丝型FPGA, Libero软件版本, 失效分析

Abstract: Anti-fuse device has the characteristics of low power consumption, high reliability and excellent anti-irradiation performance. As the widely used core chips in the aerospace field, the failure mechanism is particularly important. For the failure problem of a certain type of anti-fuse device board level application, the fault tree is listed, the suspected points are investigated one by one. With the post-simulation waveforms, the cause of the failure is finally located, and failure mechanism is analyzed. The cause of the failure is related to the development software version and other factors, which are not easily taken into account by designers because users are often unaware of the details of software version updates. To solve the failure problem, the solution is proposed by selecting samples for re-burning test. After actual testing and verification, the failure phenomenon disappears, and the improvement measures are effective.

Key words: anti-fuse FPGA, Libero software version, failure analysis