SiC功率器件辐照诱生缺陷实验研究进展<sup>*</sup>

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杨治美;高旭;李芸;黄铭敏;马瑶;龚敏

ResearchProgress of Irradiation Induced Defects Experiment ofSiCPower Device

YANG Zhimei, GAO Xu, LI Yun, HUANG Mingmin, MA Yao, GONG Min

电子与封装 . 2022, (5): 50101 . DOI: 10.16257/j.cnki.1681-1070.2022.0501