首次选用的典型裸芯片应用可靠性评价方法
武荣荣,梅亮,任翔,曹阳,庞明奇,刘净月
Application Reliability Evaluation Method for First Selection of Typical Bare Chip
WU Rongrong, MEI Liang, REN Xiang, CAO Yang, PANG Mingqi, LIU Jingyue
电子与封装
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2024, (5): 50204
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DOI: 10.16257/j.cnki.1681-1070.2024.0062
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