基于ATE与结构分析的RRAM芯片测试技术研究

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奚留华,徐昊,张凯虹,武乾文,王一伟

Research on RRAM Chip Testing Technology Based on ATE and Structural Analysis

XI Liuhua, XU Hao, ZHANG Kaihong, WU Qianwen, WANG Yiwei

电子与封装 . 2024, (7): 70206 . DOI: 10.16257/j.cnki.1681-1070.2024.0082