内嵌Flash存储器可靠性评估方法的分析及应用

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周焕富,刘伟,周成

Analysis and Application of Reliability Evaluation Method for Embedded Flash Memory

ZHOU Huanfu, LIU Wei, ZHOU Cheng

电子与封装 . 2024, (7): 70207 . DOI: 10.16257/j.cnki.1681-1070.2024.0083