协同分析在集成电路失效定位中的应用探讨

导航

虞勇坚，邹巧云，吕栋，陆坚

Application of Collaborative Analysis in Failure Location of Integrated Circuits

YU Yongjian, ZOU Qiaoyun, LV Dong, LU Jian

电子与封装 . 2017, (8): 36 -40 . DOI: 10.16257/j.cnki.1681-1070.2017.0101