纳米级数字集成电路老化效应分析与老化监测技术综述*
赵天津;黄乐天;谢暄;魏敬和
NanometerDigital Integrated Circuit Aging Effect Analysis and Aging MonitoringTechnology Review
ZHAO Tianjin, HUANG Letian, XIE Xuan,WEI Jinghe
电子与封装
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2020, (10): 100101
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DOI: 10.16257/j.cnki.1681-1070.2020.1005