关键词: 单粒子效应试验, 通用型, 数字电路

Abstract: Single event effect experiment is an effective method to make ground-level evaluation for the radio resistance performance of components. With the rapid development of aerospace industry, requirement of space components?is increasing year by year. The single event experiment for their performance becomes more and more frequent. This article proposed a general type experiment system for single event effect, which could satisfy the assessment demands for most of the digital circuits. The design approach for this test system is introduced from several aspects like system architecture, hardware design and software design. Depending on this system, it will be convenient to develop single event effect experiment system according to different type of digital circuits. The development period is shortened and the efficiency is improved.

Key words: single event effectexperiment, general type, digital circuits