关键词: 光伏二极管, 加速应力试验, 可靠性评价, 工作应力分布

Abstract: Combined with the application environment of photovoltaic diodes, the influence of operating life cycle, stress distribution and application environment on photovoltaic diodes are analyzed to establish a more practical application reliability model.By designing targeted accelerated stress tests, the pseudo-failure lives are calculated using test data of performance degradation and failure threshold value, and life distribution parameters under accelerated stress conditions are evaluated based on pseudo-failure life, distribution assumptions, and test for goodness of fit.The test stresses and working stresses are converted by the accelerated model applicable to each stress, and the reliability model parameters for photovoltaic diode applications are assessed to complete the application reliability evaluation. Based on the traditional evaluation method, the weight factor of working stress distribution is introduced to furtherly improve the application reliability model for photovoltaic diode, which can provide technical reference for reliability evaluation of similar devices.

Key words: photovoltaic diode, accelerated stress test, reliability evaluation, working stress distribution