中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2019, Vol. 19 ›› Issue (8): 039 -43. doi: 10.16257/j.cnki.1681-1070.2019.0811

• 微电子制造与可靠性 • 上一篇    下一篇

基于248nm扫描光刻机工艺的0.15μm GaAs单片限幅低噪声放大器

王溯源*,章军云,彭龙新,黄念宁王溯源*,章军云,彭龙新,黄念宁   

  1. 南京电子器件研究所,南京 210016
  • 收稿日期:2019-04-23 出版日期:2019-08-20 发布日期:2020-01-09
  • 作者简介:王溯源(1988.03-),男,河南确山人,2012年毕业于北京大学物理学院凝聚态物理系,获硕士学位。现为南京电子器件研究所工程师,主要从事化合物半导体光刻工艺和器件开发工作。

0.15 μm GaAs Limiter-LNA MMIC Based on 248 nm Scanner Process

WANG Suyuan*, ZHANG Junyun, PENG Longxin, HUANG Nianning   

  1. Nanjing Electronic Devices Institute, Nanjing 210016, China
  • Received:2019-04-23 Online:2019-08-20 Published:2020-01-09

摘要: 报道了一种0.15 μm GaAs 单片限幅低噪声放大器的材料设计和制作工艺,器件关键层制备使用248 nm 扫描光刻机和烘胶工艺方案。利用X波段限幅低噪声放大电路对该工艺进行了流片验证。微波测试结果显示,在7~13 GHz频段内,电路增益大于19.5 dB,在7.7 GHz处增益达22.3 dB;噪声系数小于1.98 dB,在7.2 GHz处,最小噪声1.28 dB;直流功耗为190 mW,展示了良好的器件和电路性能。

关键词: 248 nm 扫描光刻机, 烘胶工艺, X波段, 0.15 μm GaAs单片限幅低噪声放大器

Abstract: The material design and device fabrication process of 0.15 μm monolithic GaAs limiter LNA were reported, which critical layer was based on 248 nm scanner and resist thermal reflow technology. X band limiter LNA circuit was used to verify the device performance. Small signal testing results show that, in 7~13 GHz band, the circuit gain is greater than 19.5 dB, and up to 22.3 dB at 7.7GHz;the noise figure is less than 1.98 dB,and reaches its minimum 1.28 dB at 7.2 GHz; the DC power consumption is 190 mW, showing good performance of device and circuit.

Key words: 248 nm scanner, resist thermal reflow process, X band, 0.15 μm GaAs limiter LNA MMIC

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