关键词: MarchC+算法, BIST电路, 故障定位

Abstract: In the paper, the algorithm based on March C+ designing a serial/parallel BIST of Based onScan chain dual port Block RAM. The cirtuit generate the test vector, not require an external stimulus, and rely on their own decisions and get the test result is correct, the circuit notonly can be effective for BRAM accurately check and fault location, but also cannot increase the number of PAD. Finally, the paper show the system simulation.

Key words: the algorithm based on March C+, BIST cirtuit, fault local