中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

导航

电子与封装 ›› 2020, Vol. 20 ›› Issue (10): 100202 . doi: 10.16257/j.cnki.1681-1070.2020.1004

• 封装、组装与测试 • 上一篇    下一篇

一种射频基板BGA端口传输性能检测方法

笪余生1,2;张柳1,2;廖翱1,2;王睿1,2;吕英飞1,2   

  1. 英文引用格式:DA Yusheng, ZHANG Liu, LIAO Ao, et al. An RF substrate BGA port transmission performance testing method[J].Electronics&Packaging,2020, 2010: 100202.
  • 收稿日期:2020-04-18 发布日期:2020-05-14
  • 作者简介:笪余生( 1987—), 男 , 安徽桐城人, 硕士研究生, 工程师, 主要研究方向为微波毫米波电路及产品设计。

An RF Substrate BGA Port Transmission Performance Testing Method

DA Yusheng1,2, ZHANG Liu1,2, LIAO Ao1,2, WANG Rui1,2, LYU Yingfei1,2   

  1. 1. The 29 Research Institute of CETC,Chengdu 610036, China;
  • Received:2020-04-18 Published:2020-05-14

摘要: 随着BGA(Ball Grid Array)封装的射频SiP(Systems in Package)产品的逐渐应用,对SiP产品及其射频基板的测试提出了很高的要求。介绍了一种射频基板BGA端口传输性能检测方法,通过设计射频BGA端口的检测装置,实现射频基板上射频BGA端口传输线的性能检测及筛选。该检测方法能够实现DC-40 GHz频率范围内的射频性能检测,且DC-40 GHz频率范围内单个装置引入插损小于1 dB,驻波优于2。基于此方法的检测装置可实现目前多数频段的基板射频BGA端口性能检测。

关键词: 射频基板, BGA端口, 检测

Abstract: With the application of RF SiP (Systems in Package) products in BGA (Ball Grid Array) package, the testing requirements of SiP products and RF substrates are very high. This paper introduces a method to detect the transmission performance of BGA port in RF substrate. The performance of RF BGA port transmission line on RF substrate is detected and screened by designing the BGA port detection device. This method can realize RF detection in? DC-40GHz,the insertion loss is less than 1dB and the standing wave is less than 2 in the frequency range of DC-40GHz.The detection device based on this method can realize the performance detection of substrate RF BGA port in most frequency bands.

Key words: RF substrate, BGA port;detection

中图分类号: