关键词: 智能家电, 失效机理, 闩锁效应, 可靠性设计

Abstract: Circuits of intelligent household appliances are much more complex. Defects or faults of circuit design, manufacturing, storage and so on will cause abnormal operation of the whole machine. Several failure circuit boards of intelligent refrigerators were collected, and failure analyses were carried out. Failure mechanisms were confirmed respectively. Several failure mechanisms related to design defects are extracted: Crosstalk signal initiated latch-up effect of microprocessors by lack of sufficient filtering circuit; feedback voltage of inductive loads such as motors broke down driving chips or microprocessors; Abnormal voltage introduced from sensors damaged microprocessors. To improve the reliability of products and reduce the repair rate of products, filter, overvoltage protection and Design For Reliability (DFR) need to be considered in circuit design.

Key words: intelligenthouseholdappliance, failuremechanism, latch-upeffect, designforreliability(DFR)