中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2021, Vol. 21 ›› Issue (10): 100106 . doi: 10.16257/j.cnki.1681-1070.2021.1009

所属专题: 微系统与先进封装技术

• “微系统与先进封装技术”专题 • 上一篇    下一篇

微系统三维异质异构集成研究进展*

张墅野;李振锋;何鹏   

  1. 哈尔滨工业大学先进焊接与连接国家重点实验室,哈尔滨 150001
  • 收稿日期:2021-04-02 出版日期:2021-10-26 发布日期:2021-07-07
  • 作者简介:张墅野(1988—),男,黑龙江五常人,博士,副教授,研究方向包括先进电子封装与3D系统级封装、光烧结柔性印刷电子技术与智能电子封装、先进纳米材料与高端电子器件系统集成与封装等。

Progress on 3D Heterogeneous Integration of Microsystem

ZHANG Shuye, LI Zhenfeng, HE Peng   

  1. State Key Lab of Advanced Welding andJoining, Harbin Institute of Technology, Harbin 150001, China
  • Received:2021-04-02 Online:2021-10-26 Published:2021-07-07

摘要: 随着芯片应用的不断深入和产业化的不断发展,持续减小的特征尺寸使得摩尔定律的发展愈发困难,微系统已然成为电子技术的重要方向之一。三维异质异构集成着重于解决系统级的集成互连,其聚焦量级为亚微米至10 μm,并以较低的成本连通了从微纳连接到系统级集成的桥梁。微系统三维异质异构集成技术正在逐步向三维堆叠、多功能一体化、混合异构集成方向发展,这使得微系统具有集成度高、功耗小、微小型化、可靠性高等优点。对微系统三维异质异构集成的定位与发展形态、国内外研究现状、应用领域与应用前景等进行了综述。

关键词: 微系统, 三维异质异构集成, 电子封装, 可靠性

Abstract: With the continuous reduction of chip feature size, the continuation of Moore's Law becomes increasingly difficult, and microsystem has become one of the important orientations of electronic technology. 3D heterogeneous integration is the most optimal means for the microsystem to achieve the system function, performance, cycle and cost of integrated system. Focusing on the issues including system integration and interconnection in submicron to 10 μm orders of magnitude, 3D heterogeneous integration breaks the scale barrier from micro-nano technology to system integration at the acceptable cost. 3D heterogeneous integration of microsystem is gradually developing towards 3D stacking, multi-function integration and hybrid heterogeneous integration, which makes the microsystems have the advantages of high integration, low power consumption, miniaturization and high reliability. The scale positioning and development of 3D heterogeneous integration of microsystem, the current researches at home and abroad as well as the fields and prospects of application are summarized.

Key words: microsystem, 3Dheterogeneousintegration, electronicpackaging, reliability

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