先进制程芯片失效定位技术现状及发展*
李振远,徐昊,贾沛,万永康,张凯虹,孟智超
Current Status and Development of Advanced Process Chip Failure Localization Technology
LI Zhenyuan, XU Hao, JIA Pei, WAN Yongkang, ZHANG Kaihong, MENG Zhichao
电子与封装
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2024, (4): 40402
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DOI: 10.16257/j.cnki.1681-1070.2024.0041
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