一种基于CS32F0XX芯片的ADC测试结构的优化方法及其FPGA实现
王月玲，杨晓刚，鲍宜鹏
An Optimization Method of ADC Test Structure Based on CS32F0XX Chip and its FPGA Implementation
WANG Yueling, YANG Xiaogang, BAO Yipeng
电子与封装
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2018, (8): 9
-12
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DOI: 10.16257/j.cnki.1681-1070.2018.0084
