关键词: ATE转移, 测试向量转换, 测试数据分析

Abstract: As the cost of integrated circuit testing increases, the transfer of chips test from high-performance Automation Test Equipment (ATE) to lower-level ATE can save corresponding test costs. The ATE transfer process involves the development of test programs and the conversion of test pattern. After that, the test data obtained from the two different ATEs are compared to verify the validity and accuracy of the ATE transfer process (named as correlation). This study is based on a high-performance 28 nm solid state drive (SSD) controller. The test platform is transferred from Advantest's V93K to Teradyne's J750, and some Python scripts are used for pattern conversion and correlation of test data, to achieve the goal of reducing the cost of chip testing.

Key words: ATEtransfer, testpatternconversion, analysisoftestdata