中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2024, Vol. 24 ›› Issue (3): 030203 . doi: 10.16257/j.cnki.1681-1070.2024.0020

• 封装、组装与测试 • 上一篇    下一篇

基于小型化模块相位噪声的间接测试方法

胡劲涵,陈文涛,邵海洲   

  1. 中国电子科技集团公司第五十八研究所,江苏 无锡? 214035
  • 收稿日期:2023-07-21 出版日期:2024-03-27 发布日期:2024-03-27
  • 作者简介:胡劲涵(1993—),男,陕西西安人,硕士,工程师,主要研究方向为射频/微波电路模块设计与测试。

Indirect Test Method Based on Phase Noise of Miniaturized Modules

HU Jinhan, CHEN Wentao, SHAO Haizhou   

  1. China ElectronicsTechnology Group Corporation No.58Research Institute, Wuxi 214035, China
  • Received:2023-07-21 Online:2024-03-27 Published:2024-03-27

摘要: 收发电路模块的本振信号质量对系统的整体性能有重要影响。小型化模块由于尺寸的限制,无法在本振的输出端设置测试端口,因此无法直接在本振的输出端准确地测试相位噪声。提出了一种针对小型化收发电路模块本振信号相位噪声的间接测试方法,该方法需要测试模块的输入/输出信号的功率、相位噪声以及整个收发通路的增益和噪声系数,通过公式计算得到本振信号的相位噪声。采用此方法对小型化收发电路模块进行测试,将得到的相位噪声结果与器件指标进行对比,两者高度一致,从而验证了间接测试方法的正确性和有效性。

关键词: 相位噪声, 间接测试, 本振, 小型化模块

Abstract: The quality of the signal from the local oscillator of the transceiver circuit module plays an important role in the overall performance of the system. Due to the size limitation of miniaturized modules, it is not possible to set up a test port at the output end of the local oscillator, and therefore it is not possible to accurately test the phase noise directly at the output end of the local oscillator. An indirect test method for the phase noise of the local oscillator signal of a miniaturized transceiver circuit module is proposed, which requires testing the power and the phase noise of the input/output signals of the module, and the gain and noise figure of the entire transceiver pathway, and obtaining the phase noise of the local oscillator signal by means of a formula. The miniaturized transceiver circuit module is tested using this method, and the phase noise results obtained are compared with the device specifications, which are highly consistent, thus verifying the correctness and validity of the indirect test method.

Key words: phase noise, indirect test, local oscillator, miniaturized module

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