中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2021, Vol. 21 ›› Issue (12): 120203 . doi: 10.16257/j.cnki.1681-1070.2021.1212

• 封装、组装与测试 • 上一篇    下一篇

铜带缠绕型焊柱装联结构的植柱工艺参数优化*

田文超1;刘美君1;辛菲1;张国光2;陈逸晞2   

  1. 1. 西安电子科技大学机电工程学院,西安 710068;2. 佛山市蓝箭电子股份有限公司,广东 佛山 528051
  • 收稿日期:2021-07-07 出版日期:2021-12-28 发布日期:2021-08-25
  • 作者简介:田文超(1968—),男,江苏无锡人,博士,教授,电子封装技术国家“双万计划”一流专业创始人和负责人,主要研究方向为先进封装与高密度组装、微机电技术。

Optimization of Process Parameters of CopperBelt Winding Welding Column Assembly Structure

TIAN Wenchao1, LIU Meijun1, XIN Fei1, ZHANG Guoguang2, CHEN Yixi2   

  1. 1. Schoolof Mechano-Electronic Engineering, XidianUniversity, Xi’an 710068, China;2. Foshan Blue Rocket Electronics Co., Ltd., Foshan 528051, China
  • Received:2021-07-07 Online:2021-12-28 Published:2021-08-25

摘要: 陶瓷柱栅阵列封装(Ceramic Column Grid Array,CCGA)器件已在航空航天等高可靠性产品中得到了广泛应用,其中铜带缠绕型焊柱因其强度更高、韧性更好的优良性能而备受关注。针对铜带缠绕型CCGA器件的植柱工艺,通过ANSYS数值模拟分析,仿真研究了焊柱尺寸、回流曲线、焊膏厚度等参数对CCGA器件残余应力及变形量的影响,并通过正交试验寻找最佳工艺参数。结果表明,植柱工艺中制备铜带缠绕型CCGA器件的最优工艺组合为焊柱内径0.40 mm、柱高3.81 mm、焊料厚度30.00 μm、降温速率2.00 ℃/s。

关键词: 铜带缠绕型焊柱, 有限元仿真, 残余应力

Abstract: Ceramic column grid array (CCGA) packaging devices have been widely used in aerospace and other high reliability products, among which the copper strip winding welding column has attracted more attention because of its higher strength and better toughness. Using ANSYS finite element analysis software, the influence of parameters such as welding column structure size, reflux curve and solder paste thickness on CCGA residual stress and deformation is simulated and analyzed, and the optimal process parameters are found through orthogonal test. The results show that the optimal process combination for preparing copper-strip winding CCGA device is as follows: 0.40 mm inner diameter of welding column, 3.81 mm column height, 30.00 μm solder thickness and 2.00 ℃/s cooling rate.

Key words: copperstripwindingweldingcolumn, finiteelementsimulation, residualstress

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