中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2017, Vol. 17 ›› Issue (6): 5 -9. doi: 10.16257/j.cnki.1681-1070.2017.0066

• 封装、组装与测试 • 上一篇    下一篇

球栅阵列可焊性测试

马清桃,王伯淳,周春玲   

  1. 中国航天科工集团第四研究院元器件可靠性分中心,湖北 孝感 432000
  • 收稿日期:2017-03-17 出版日期:2017-06-20 发布日期:2017-06-20
  • 作者简介:马清桃(1972—),女,湖北宜昌人,湖北工业大学计算机科学与技术专业学士,高级工程师,现在中国航天科工集团第四研究院从事电子元器件筛选检测工作。

Wetting Balance Test for BGA Devices

MA Qingtao,WANG Bochun,ZHOU Chunling   

  1. No.4 Institute Components Reliability Sub-centers of China Aerospace Science & Industry Corp., Xiaogan 432000,China
  • Received:2017-03-17 Online:2017-06-20 Published:2017-06-20

摘要: 在武器装备系统中,可焊性测试是鉴定电子元器件引出端质量和共面工艺等指标的一项重要措施。尤其在装机前,因为可焊性的隐患可能带来无法估量的损失。在检测分析工作中,使用什么方法正确评估电子元器件的可焊性显得尤为重要。通过球栅阵列器件的可焊性测试方法的分析研究,对测试中遇到的问题进行归纳和总结,以具体的示例进行分析和验证,提出了 BGA可焊性测试中可参考的标准、应注意的问题等,为同行业者提供指导和借鉴。

关键词: 可焊性, BGA, 有铅, 无铅

Abstract: In orderto reduce the loss and recurrence difficulty as much as possible,itis necessary to do much experiments ortests to ensure the quality and reliability ofthe electronic components in military weapon system, especially before the whole system is completely loaded.Wetting Balance Testis an importantmethod used to judge the specifications such as the interface soldering properties and coplanarity properties.Itis very important to test the solderability of the electronic components for the detection and analysis department.The paper analyzes the problems occurred during the test of BGA device and provides some suggestions on Wetting Balance Testcovering standards and precautions.

Key words: Wetting Balance Test, BGA, leaded, lead-free

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