中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2018, Vol. 18 ›› Issue (8): 5 -8. doi: 10.16257/j.cnki.1681-1070.2018.0083

• 封装、组装与测试 • 上一篇    下一篇

集成电路真伪辨识方法

吕 栋,虞勇坚,邹巧云   

  1. 中国电子科技集团公司第五十八研究所,江苏 无锡 214035
  • 出版日期:2018-08-20 发布日期:2018-08-20
  • 作者简介:吕 栋(1975—),男,江苏无锡人,检测工程师,1995年毕业于南京无线电工业学校,主要从事半导体集成电路可靠性检测与分析工作。

Identification Methods for Integrated Circuits

LV Dong, YU Yongjian, ZOU Qiaoyun   

  1. China Electronics Technology Group Corporation No.58 Research Institute, Wuxi 214035, China
  • Online:2018-08-20 Published:2018-08-20

摘要: 随着电子产品的高度集成化,电子元器件不断更新换代,旧版本的集成电路逐步停产,加上国外公司的禁运等多种因素的影响,翻新、假冒和伪劣的集成电路越来越多,给电子产品和军用装备的可靠性带来很大的风险。按照从简单到复杂、从外部到内部、从非破坏性到破坏性的顺序介绍了几种辨识假冒伪劣集成电路的方法,通过检查集成电路的外部标识、引线、表面状况以及内部工艺,配合二筛的环境适应性试验及电性能测试,可以有效判断是否为假冒伪劣集成电路。

关键词: 集成电路, 真伪辨识, 外观, 打磨

Abstract: With the high integration of electronic products, multi-factor of the electronic components are continuous updating and replacement, the old version of the Integrated Circuits are off production and the embargoes of foreign companies, etc. There are more and more Integrated Circuits of refurbishment, counterfeiting and shoddy, that makes great risks to the reliability of electronic products and military equipments. This paper introduced several methods to identify counterfeit and fake IC in accordance with fake and shoddy IC, from simple to complex, from external to interior, from non-destructive to destructive. By checking the external identification, leads, surface condition and internal technology of the IC, the environmental adaptability test and electrical performance test of the two sieves can be used to judge whether it is a fake and inferior IC effectively.

Key words: integrated circuit, identification, appearance, face-lifting

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