中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2018, Vol. 18 ›› Issue (10): 17 -20. doi: 10.16257/j.cnki.1681-1070.2018.0109

• 封装、组装与测试 • 上一篇    下一篇

通用印制线路板对芯片老化工艺效率提升的研究

李小亮,何 静   

  1. 中国电子科技集团公司第五十八研究所,江苏 无锡 214035
  • 收稿日期:2018-06-08 出版日期:2018-10-20 发布日期:2018-10-20
  • 作者简介:李小亮(1990—),男,江苏泰州人,2013年毕业于江南大学,主要从事集成电路可靠性分析与设计工作。

Research on Improving Efficiency of Aging Test by Universal Aging Test Printed Circuit Board

LI Xiaoliang, HE Jing   

  1. China Electronics Technology Group Corporation No.58 Research Institute, Wuxi 214035, China
  • Received:2018-06-08 Online:2018-10-20 Published:2018-10-20

摘要: 老化试验是指在遵循“浴盆曲线”这一原理的前提下,在元器件筛选试验中将已损坏的器件剔除出去,从而提高元器件的整体可靠性。主要研究如何让同一种封装尺寸的芯片使用同一种老化板,无需因其功能不同而制作不同的老炼加电印制板,从而减少人工和硬件成本,提高加电效率。通过对芯片和老化板的研究,设计出相对应的母板和子板,最终成功完成了通用板的设计,并在此基础上进行扩展,涉及到不同尺寸的芯片种类达三十几种,覆盖芯片型号有数百种。

关键词: 老化试验, 通用印制板, 母板, 子板

Abstract: The aging test is to eliminate the damaged components in the element screening test on the premise of following the principle of the "bathtub curve", so as to improve the overall reliability of the components. The article mainly studies how to use the same aging test printed circuit board for chips of the same package size. It is not necessary to make different aging test printed circuit boards due to their different functions , thereby reducing manual and hardware costs and improving efficiency. Through the research of chips and aging test printed circuit boards , corresponding mother boards and daughter boards were designed. The design of universal aging test printed circuit boards was successfully completed. Based on this, the design was expanded, involving more than 30 types of chips of different sizes. There are hundreds of types of cover chips.

Key words: aging test, universal printed circuit board, mother board, daughter board

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