中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2021, Vol. 21 ›› Issue (7): 070202 . doi: 10.16257/j.cnki.1681-1070.2021.0706

• 封装、组装与测试 • 上一篇    下一篇

功率器件引线键合参数研究

张玉佩;张茹;戎光荣   

  1. 烟台台芯电子科技有限公司,山东 烟台 260046
  • 收稿日期:2020-12-28 出版日期:2021-07-22 发布日期:2021-01-27
  • 作者简介:张玉佩(1988—),女,山东济宁人,硕士研究生,电子信息技术中级职称,现从事集成电路芯片封装相关工作。

Research onParameters of Wire Bonding for Power Devices

ZHANG Yupei, ZHANG Ru, RONG Guangrong   

  1. YantaiTaixin Electronics Technology Co., Ltd, Yantai 260046, China
  • Received:2020-12-28 Online:2021-07-22 Published:2021-01-27

摘要: 引线键合作为芯片封装的关键工艺,其键合质量直接影响器件性能。功率器件普遍采用粗铝丝超声楔形键合,对于芯片区域第一键合点和第二键合点键合工艺参数进行了系统研究,并以剪切力作为衡量键合质量的方法,采用单因子分析法,研究各个参数对键合点强度的影响,利用正交试验方法,确定最优参数,并比较两类键合点的差异,为该领域引线键合工艺参数设定提供参考。

关键词: ?超声键合, 剪切力, 单因子, 正交试验

Abstract: As the key process of chip packaging, the quality of wire bonding directly affects the performance of the device. Generally, thick aluminum wire is used in ultrasonic wedge bonding for power devices. In this paper, technical parameters of the first bond and the second bond on the chip were systematically studied and shear force were used as a method to measure bonding quality. Effect of technical parameters on bonding strength was analyzed with single factor analysis. The optimal parameter was determinated and the differences between the two types of bonds were compared with orthogonal experiment method, which providing a reference for setting parameters of wire bonding in this field.

Key words: ultrasonicbonding, shearforce, singlefactor, orthogonalexperiment

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