中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2021, Vol. 21 ›› Issue (9): 090203 . doi: 10.16257/j.cnki.1681-1070.2021.0904

• 封装、组装与测试 • 上一篇    下一篇

Cu-Sn-Cu互连微凸点热压键合研究

张潇睿   

  1. 中国民用航空飞行学院航空工程学院,四川 广汉 618307
  • 收稿日期:2021-03-02 发布日期:2021-03-27
  • 作者简介:张潇睿(1992—),男,四川广汉人,助教,研究方向为微电子封装及磁流变减振。

Study ofCu-Sn-Cu Interconnection Using Thermal Compression Flip Chip Bonding

ZHANG Xiaorui   

  1. AviationEngineering College, Civil Aviation Flight University of China,Guanghan 618307, China
  • Received:2021-03-02 Published:2021-03-27

摘要: 随着多数产品更高的I/O数的需求,微铜柱凸点已经成为倒装芯片领域的主流,而热压倒装焊则是目前使用最多的键合方式之一。针对一款Cu-Sn-Cu倒装芯片,基于日本Athlete公司的CB-600低荷重半自动倒装键合机,以研究芯片键合质量为目标,完成了不同参数条件下的芯片键合样品,并通过光学显微镜和拉剪力测试机对样品的键合质量进行了比较,得到了键合参数对键合质量的影响规律。

关键词: 微铜柱凸点, 热压键合, 键合参数, 拉剪力测试

Abstract: With the increasing demand of more I/O in most products, micro copper pillar solder bump has become the mainstream of flip chip field, and thermal compression bonding is one of the most widely used bonding methods. This paper focuses on a Cu-Sn-Cu flip chip, and aims at the quality of chip bonding, the samples with different parameters were completed by using CB-600 of Athlete in Japan. The bonding quality of the samples was compared by optical microscope and tensile shear tester, and the influence of bonding parameters on bonding quality was obtained.

Key words: microcopperpillarsolderbump, thermalcompressionbonding, bondingparameters, tensilesheartest

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