中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2023, Vol. 23 ›› Issue (11): 110202 . doi: 10.16257/j.cnki.1681-1070.2023.0144

• 封装、组装与测试 • 上一篇    下一篇

基于陶瓷基板微系统T/R组件的焊接技术研究

王禾1,2,周健2,戴岚1,张丽1   

  1. 1. 中国电子科技集团公司第三十八研究所,合肥? 230031;
  • 收稿日期:2023-06-13 出版日期:2023-11-28 发布日期:2023-11-28
  • 作者简介:王禾(1992—),男,安徽合肥人,硕士,工程师,主要从事微系统集成技术、微组装及先进封装工艺技术的研究。

Research onWelding Technology for Micro-System T/R ComponentsBased on Ceramic Substrates

WANG He1,2, ZHOU Jian2, DAI Lan1, ZHANG Li1   

  1. 1. China Electronics Technology Group Corporation No.38 Research Institute, Hefei 230031, China; 2.School of Materials Science and Engineering, Southeast University, Nanjing 211189, China
  • Received:2023-06-13 Online:2023-11-28 Published:2023-11-28

摘要: 陶瓷基板微系统T/R组件具有体积小、密度高、轻量化等特点,正在逐步取代传统微组装砖式T/R组件。在微系统封装新技术路线的引领下,T/R组件对于微电子焊接技术的需求发生了较大变化。针对基于陶瓷基板微系统T/R组件的微电子焊接技术展开了论述,重点阐述了新技术路线与传统技术路线对于技术需求的差异,对围框钎焊、焊球/焊柱钎焊、基板与器件钎焊、高密度键合及盖板气密封焊等关键技术进行了介绍,归纳并总结了近年来相关技术领域的研究现状,并给出了现有技术水平条件下满足高可靠、低成本封装需求的最优工艺方法,为微电子焊接技术的发展提供了参考。

关键词: 微电子焊接, 陶瓷基板, T/R组件

Abstract: Ceramic substrate micro-system T/R components have the characteristics of small volume, high density and light weight, which are gradually replacing the traditional micro-assembly brick multi-chip T/R components. Under the leadership of new system of micro-system packaging, the demand for microelectronic welding technology in T/R components has changed considerably.The microelectronic welding technology based on ceramic substrate micro-system T/R components is discussed, the discussion focuses on the differences between the new technology route and the traditional technology route for the technical requirements. Key technologies such as frame brazing, welding ball/pillar brazing, substrate and the device brazing, high-density bonding and cover plate gas sealing welding are introduced. The research status in relevant technical fields in recent years is summarized, and the optimal process method to meet the requirements of high reliability and low cost packaging under the current technological level conditions is provided, providing a reference for the development of microelectronic welding technology.

Key words: microelectronic welding, ceramic substrate, T/R components

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