中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2023, Vol. 23 ›› Issue (5): 050203 . doi: 10.16257/j.cnki.1681-1070.2023.0044

• 封装、组装与测试 • 上一篇    下一篇

金锡合金熔封中的焊料内溢控制

肖汉武1;陈婷1;颜炎洪1;何晟2   

  1. 1.无锡中微高科电子有限公司,江苏 无锡 214035; 2. 宜兴吉泰电子有限公司,江苏 无锡? 214221
  • 收稿日期:2022-10-08 出版日期:2023-05-23 发布日期:2023-03-17
  • 作者简介:肖汉武(1969—),男,湖北大冶人,高级工程师,主要研究方向为电子封装。

The Controlof Solder Inner Overflowing in Gold-Tin Solder Sealing

XIAO Hanwu1, CHEN Ting1, YAN Yanhong1, HE Sheng2   

  1. 1. WuxiZhongWei High-tech Electronics Co.,Ltd., Wuxi 214035, China; 2. Yixing Jitai ElectronicsCo.,Ltd., Wuxi214221, China
  • Received:2022-10-08 Online:2023-05-23 Published:2023-03-17

摘要: 金锡合金熔封是气密封装的主要封帽技术之一,焊料内溢是金锡合金熔封过程中的普遍现象。焊料内溢会缩小键合引线与盖板的间距,严重的甚至会引起短路,偶尔也会导致粒子碰撞噪声检测(PIND)试验不合格。讨论了焊料内溢产生的原因,并从密封设计、封帽夹具、盖板镀层等方面提出了内溢控制措施。

关键词: 金锡熔封, 粒子碰撞噪声检测, 焊料内溢, 预熔焊料盖板, 局部镀金

Abstract: Gold-tin solder sealing is one of the main lid-sealing technologies for hermetic packaging. Solder inner overflowing is a common phenomenon in gold-tin solder sealing process. Solder inner overflowing will reduce the space between bonding wires and the cover lid, and even cause short circuit in serious cases. It can also cause particle impact noise detection (PIND) tests to fail occasionally.The causes of solder inner overflow are discussed, and the control measures for inner overflow are put forward from the aspects of packaging design, cap clamp, cover lid plating and so on.

Key words: gold-tin solder sealing, particle impact noise detection, solder inner overflowing, prefusion solder cover lid, localized gold plating

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