中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2023, Vol. 23 ›› Issue (8): 080207 . doi: 10.16257/j.cnki.1681-1070.2023.0114

• 封装、组装与测试 • 上一篇    下一篇

多次回流焊后金属间化合物及焊点强度分析

常青松;徐达;袁彪;魏少伟   

  1. 中国电子科技集团公司第十三研究所,石家庄 050051
  • 收稿日期:2023-03-22 出版日期:2023-08-24 发布日期:2023-08-24
  • 作者简介:常青松(1974—),男,河北邯郸人,高级工程师,主要研究方向为先进集成工艺制造与微组装工艺。

Analysis of Intermetallic Compounds and Solder Joint Strength AfterMultiple Reflow Soldering

CHANG Qingsong, XU Da, YUAN Biao, WEI Shaowei   

  1. China Electronics Technology GroupCorporation No.13 Research Institute, Shijiazhuang 050051, China
  • Received:2023-03-22 Online:2023-08-24 Published:2023-08-24

摘要: 以BGA基板焊接为研究对象,分析了无铅焊料(SAC305)与NiPdAu镀层经过多次回流焊后金属间化合物(IMC)厚度与焊点强度的变化趋势。试验结果表明,通过优化SAC305锡球与Ni层焊盘的回流焊接温度曲线,IMC层的厚度可控制在2 μm左右。同时,镀层中Pd的存在降低了(Cu,Ni, Pd)6Sn5生长的活化能,抑制了不良IMC的形成。经过多次回流焊后,SAC305锡球与NiPdAu镀层的微观界面和剪切强度仍然保持着较好的水平,经过回流焊3次后的焊点仍具有较高的可靠性。

关键词: 无铅焊料, 金属间化合物, 回流焊, 焊点

Abstract: Taking the soldering of BGA substrate as the research object, the variation trends of intermetallic compound (IMC) thickness and solder jointstrength after multiple reflow soldering between lead-free solder (SAC305) and NiPdAu plating layer are analyzed. The experimental results show that by optimizing the reflow soldering temperature curve between SAC305 solder balls and Ni layer pads, the thickness of IMC layer can be controlled at about 2 μm, and the presence of Pd in the plating reduces the activation energy of (Cu, Ni, Pd)6Sn5 growth and inhibits the formation of bad IMC at the same time. After multiple reflows, the microscopic interface and shear strength of SAC305 solder balls and NiPdAu plating layer still maintain a good level. The solder joints still have high reliability after reflow soldering for 3 times.

Key words: lead-free solder, intermetallic compounds, reflow soldering, solder joint

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