中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2016, Vol. 16 ›› Issue (11): 10 -13. doi: 10.16257/j.cnki.1681-1070.2016.0124

• 封装、组装与测试 • 上一篇    下一篇

集成电路中MOS管导通电阻测量方法

韩新峰,顾卫民   

  1. 中国电子科技集团公司第58研究所,江苏 无锡 214035
  • 出版日期:2016-11-20 发布日期:2016-11-20
  • 作者简介:韩新峰(1987—),男,山东潍坊人,硕士研究生,毕业于南昌航空大学控制工程专业,现在中国电子科技集团公司第58研究所从事集成电路测试研发工作。

Studies of MOS Turn-on Resistance Measurement Methods

HAN Xinfeng, GU Weimin   

  1. China Electronics Technology Group Corporation No.58 Research Institute, Wuxi 214035, China
  • Online:2016-11-20 Published:2016-11-20

摘要: MOS管是一种常见的半导体功率器件,随着半导体产业的不断发展和进步,MOS管的各方面性能也得到大幅度的提高,被广泛应用于开关电源、节能灯、电源转换和电源控制等领域。在功率电路中,MOS作为一种多子功率开关器件,其导通电阻是至关重要的参数之一,会影响到应用电路的稳定性和功耗。因此在集成电路测试中对于MOS管导通电阻的精确测量显得尤为重要。对于MOS管导通电阻的测量做了详细分析,并介绍了两种可以准确测量MOS管导通电阻的方法。

关键词: MOS管, 导通电阻, 测试

Abstract: MOS is a common power semiconductor devices and has witnessed drastic improvement along with the semiconductor industry and wide application in switching power supply, energy-saving lamps, power conversion and power control. MOS is used as a multi power switching devices in power circuit where conduction resistance is one of the key parameters. As conduction resistance affects the stabil-ity and power consumption of the circuit, its accurate measurement is of great importance. This paper makes a detailed analysis on the resistance of MOS pipe, and introduces several methods to measure the MOS tube conduction resistance.

Key words: MOS tube, conducting resistance, test

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