中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2024, Vol. 24 ›› Issue (1): 010203 . doi: 10.16257/j.cnki.1681-1070.2024.0008

• 封装、组装与测试 • 上一篇    下一篇

接触式、双界面式智能卡机械强度测试失效及改善措施

吴彩峰;王修垒;仝飞   

  1. 北京中电华大电子设计有限责任公司射频识别芯片检测技术北京市重点实验室,北京 ?102209
  • 收稿日期:2023-06-25 出版日期:2024-01-15 发布日期:2024-01-15
  • 作者简介:吴彩峰(1973—),男,吉林扶余人,硕士研究生,高级工程师,主要从事集成电路制造和封装研究工作。

Mechanical Strength Test Failure and Improvement Measures of Contact and Dual-Interface Smart Cards

WU Caifeng, WANG Xiulei, TONG Fei   

  1. Beijing Key Laboratory of RFID ChipDetection Technology, CEC HuadaElectronic Design Co., Ltd., Beijing 102209, China
  • Received:2023-06-25 Online:2024-01-15 Published:2024-01-15

摘要: 机械强度是评价接触式、双界面式智能卡可靠性的重要指标。机械强度测试过程中产品失效情况时有发生。因此,对接触式、双界面式智能卡机械强度测试中出现的失效现象进行深入研究十分重要。从智能卡的结构与材料及制造全过程,即芯片制造、模块封装、智能卡组装3个生产环节着手,研究影响智能卡机械强度的因素。通过对裸芯片的物理特征、载带类型、裸芯片表面粗糙度、模块密封工艺及铣槽参数等进行分析与总结,提出改善智能卡机械强度的措施及优化方向。

关键词: 智能卡, 机械强度, 三轮测试, 失效现象

Abstract: Mechanical strength is an important indicator for evaluating the reliability of contact and dual-interface smart cards. Product failures occur from time to time during mechanical strength testing. Therefore, it is very important to conduct an in-depth study of failure phenomena those occur during mechanical strength testing of contact and dual-interface smart cards. Starting from the structure and materials of smart cards and the whole manufacturing process, including chip manufacturing, module packaging and smart card assembly, the factors affecting the mechanical strength of smart cards are studied. By analyzing and summarizing the physical characteristics of bare chips, carrier types, surface roughness of bare chips, sealing process of the modules and the milling groove parameters, measures and optimization directions for improving the mechanical strength of smart cards are proposed.

Key words: smart cards, mechanical strength, three-wheel testing, failure phenomenon

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