中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2016, Vol. 16 ›› Issue (2): 5 -7. doi: 10.16257/j.cnki.1681-1070.2016.0014

• 封装、组装与测试 • 上一篇    下一篇

叠层芯片引线键合技术在陶瓷封装中的应用

廖小平,高 亮   

  1. 无锡中微高科电子有限公司,江苏 无锡 214035
  • 出版日期:2016-02-20 发布日期:2016-02-20
  • 作者简介:廖小平(1986—),男,江西宜春人,硕士,现主要从事集成电路封装技术研究与应用工作。

Application of Wire Bonding of Multi-Stack Die in the Ceramic Package

LIAO Xiaoping, GAO Liang   

  1. Wuxi Zhongwei High-Tech Electronics Co., Ltd. Wuxi 214035, China
  • Online:2016-02-20 Published:2016-02-20

摘要: 随着集成电路封装技术朝着高密度封装方向发展,同时基于系统产品不断多功能化的需求,出现了叠层封装技术。介绍了芯片叠层封装的传统引线封装结构,详细阐述了一种新型的芯片十字交叉型叠层封装结构,并结合这种封装结构在陶瓷封装工艺中的应用进行了具体实施与探讨,并进行了引线键合可靠性考核试验。通过试验研究表明叠层芯片引线键合技术也可广泛应用于陶瓷封装产品中。

关键词: 叠层芯片, 悬空键合, 低弧键合, 3D封装

Abstract: With the development of the integrated circuit packaging technology towards the direction of high density packaging, and based on the requirement of more functional system products, which have been promoting the development of multi-stack package. In this paper, the traditional typical stacked chip packages are introduced. A cross type which is a new type of stacked chip package is described in detail. The cross type application in the ceramic packaging technology is discussed, and the reliability test of wire bonding is also researched. According to the study conclusion, the technology of wire bonding of multi-stack die also can be widely used in the ceramic packaging products.

Key words: multi-stack die, 3D package, low profile wire bonding, wire bonding on overhang

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