关键词: 测试技术, ATE, MTL, 功能码

Abstract: With the development of science and technology, IC is widely used in all varieties of products. In the design of super IC, especially in the design of SOC IC, it is normal to embed lots of storages IC. Testing memory is an important part of IC tesing. V93000 ATE is a scalable platform. It includes digital testing, analog testing and RF testing, etc. It can process wafer sort testing and final test of highly integrated IC. This text explains the working theory of V93000 (ATE) MTL to produce patterns, and analyses the advantages of MTL comparing with traditional ways, for example flexibility, easy to achieve and small quantity.

Key words: testing technology, ATE, MTL, pattern file