中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2016, Vol. 16 ›› Issue (10): 43 -47. doi: 10.16257/j.cnki.1681-1070.2016.0121

• 微电子制造与可靠性 • 上一篇    

微波晶体管满功率老炼技术研究

王小萍,李雪,张利敏,秦皓   

  1. 中国电子科技集团公司第55研究所,南京 210016
  • 收稿日期:2016-06-01 出版日期:2016-10-20 发布日期:2016-10-20
  • 作者简介:王小萍(1975—),女,江苏泰州人,工程师,工作于中国电子科技集团公司第55研究所,多年来一直从事电子元器件二次筛选工作。

Research of Full-power Aging Technology for Microwave Transistor

WANG Xiaoping,LI Xue,ZHANG Limin,QIN Hao   

  1. China Electronics Technology Group Corporation No.55 Research Institute,Nanjing 210016,China
  • Received:2016-06-01 Online:2016-10-20 Published:2016-10-20

摘要: 对35 micro-x封装的微波晶体管防自激老化电路的各部分功能进行了详细介绍,讨论了如何判定管子是否处于稳定工作状态的方法。通过在测试间里搭建老化电路,模拟实际老炼状态,使用红外热像仪测试壳温的方法,比较了不同散热条件下的壳温测试数据,得出了管子的壳温以及管帽和管底之间的温度差。试验证明:在管底使用铝块和导热硅胶相结合散热的方法,能解决35 micro-x封装形式的低结温晶体管老化过程中的结温控制问题。

关键词: 微波管, 壳温, 电老炼, 导热硅胶

Abstract: In the paper,functions of each part of the anti-self-oscillation aging circuit for 35 micro-x packaged microwave transistors are introduced in detail.And the method of determining whether the transistor is in stable state or not is discussed.In order to simulate the actual aging state,an aging circuit is built in the test room.In this way,the values of case temperature under different cooling conditions are compared,and the temperature difference between the top and the bottom of the case is figured out by infrared thermal imager. Results show that the junction temperature is controlled by using aluminum block and thermally conductive silica gel during the aging process of 35 micro-x package.

Key words: microwave transistor, case temperature, electrical aging, thermally conductive silica gel

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