中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2017, Vol. 17 ›› Issue (5): 12 -15. doi: 10.16257/j.cnki.1681-1070.2017.0056

• 封装、组装与测试 • 上一篇    下一篇

翼型引线表贴集成电路共面性检测研究

杨城,贺颖颖,谭晨   

  1. 湖北航天技术研究院计量测试技术研究所,湖北孝感432100
  • 收稿日期:2017-02-21 出版日期:2017-05-19 发布日期:2017-05-19
  • 作者简介:杨城(1988—),男,浙江金华人,毕业于西北工业大学,本科,主要从事电子元器件可靠性技术研究。

Study of Coplanarity Test for Gull Wing Lead SMDs

YANG Cheng,HE Yingying,TAN Chen   

  1. The Metrology and Measurement Institute of Hubei Space Academy,Xiaogan 432100,China
  • Received:2017-02-21 Online:2017-05-19 Published:2017-05-19

摘要: 随着封装向轻、薄、小的高密度方向发展,封装引出端从传统的通孔安装THT(Through Hole Technology)向表面安装SMT(Surface Mounting Technology)过渡,引线节距越来越小,I/O数越来越多,特别是细节距封装的表贴集成电路(SMD,Surface Mounting Devices)。细节距封装的SMD引线变薄、变窄,因此引线易弯曲变形造成引线焊接部位不共面,安装时个别引线和PCB板接触不良导致漏接、虚接。介绍了一种精度高和效率较优的翼型引线SMD引线共面性检测方法。

关键词: 细节距, 翼形引线, 共面性测量

Abstract: With the rapid development of microelectronics technology,THT is now being replaced by SMT. Especially,the fine pitch SMD is highly integrated with more pins and smaller pitch.But the limitation of fine pitch SMD is the lead coplanarity problem caused by lead deforming.To improve the solder reliability,this article introduces a precise and efficientcoplanarity testmethod for gullwing lead SMDs.

Key words: fine pitch, gullwing lead, coplanarity test

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