中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2022, Vol. 22 ›› Issue (2): 020201 . doi: 10.16257/j.cnki.1681-1070.2022.0209

• 封装、组装与测试 • 上一篇    下一篇

平行缝焊盖板镀层结构的热分析

蒋涵1;徐中国2;蒋玉齐1   

  1. 1. 无锡中微高科电子有限公司,江苏 无锡 214072;2. 中科芯集成电路有限公司,江苏 无锡 214072
  • 收稿日期:2021-07-27 出版日期:2022-02-23 发布日期:2021-10-01
  • 作者简介:蒋涵(1994—),女,山东淄博人,硕士,工程师,现从事微电子封装相关工作。

Thermal Analysis ofPlating Structure on Parallel Seam Sealing Process

JIANG Han1, XU Zhongguo2, JIANG Yuqi1   

  1. 1.Wuxi Zhong Wei High-Tech Electronics Co.,Ltd., Wuxi 214072, China;2. China Key System & Integrated Circuit Co., Ltd., Wuxi 214072, China
  • Received:2021-07-27 Online:2022-02-23 Published:2021-10-01

摘要: 平行缝焊是陶瓷封装应用最为广泛的高可靠性气密性封装方式之一。由于焊接过程中,盖板表面镀层会发生熔化、破坏等过程,可伐基底会被暴露在环境中,导致盐雾腐蚀失效。利用Abaqus有限元分析软件,选择2种代表性的可伐盖板镀层结构,分析不同加载温度条件下可伐盖板以及其表面镀层的温度分布。仿真结果表明,当可伐盖板采用Ni/Au的镀层结构时,控制焊接温度范围为1200~1400 ℃,有希望保证平行缝焊耐盐雾腐蚀可靠性,并给出其耐盐雾腐蚀机理。

关键词: 平行缝焊, 陶瓷封装, 仿真

Abstract: Parallel seam sealing process is one of the most reliability hermetic sealing technology extensivly used in ceramic package. The plating of lids will be melted during the welding process and the kovar lid will be exposed to the environment, which leads to the failure of salt-spray corrosion. Two kinds of plating structure are chosen and Abaqus software is used to analyze the distribution of temperature on kovar lid and its plating. The results show that, Ni/Au plating structure can ensure the reliability of parallel seam sealing on salt-spray corrosion during the temperature range of 1200~1400 ℃, which hopes to ensure the reliability of the salt spray corrosion resistance of the parallel welds, and the mechanism of salt-spray corrosion resistance is given.

Key words: parallelseamsealing, ceramicpackage, simulation

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