中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2019, Vol. 19 ›› Issue (5): 041 -44. doi: 10.16257/j.cnki.1681-1070.2019.0510

• 微电子制造与可靠性 • 上一篇    下一篇

基于离子注入片的单片外延炉温度研究

肖健,任凯,袁夫通,徐卫东   

  1. 南京国盛电子有限公司,南京 211111
  • 收稿日期:2019-01-23 出版日期:2019-05-19 发布日期:2019-05-19
  • 作者简介:肖 健(1989—),男,江苏苏州人,硕士,工程师,主要从事硅外延设备的技术研发工作。

Research on Temperature of Single Wafer Epitaxial Equipment Based on Ion Implanted Wafer

  1. XIAO Jian,REN Kai,YUAN Futong,XU Weidong
  • Received:2019-01-23 Online:2019-05-19 Published:2019-05-19

摘要: 精准的温度控制是IC 外延的关键,基于8 英寸离子注入片,对影响单片外延炉温度的关键因素进行了研究。实验结果表明改变OFFSET 参数,外延炉边缘温度随ΔT 同步变化,中心和R/2 处温度没有影响;中心热电偶安装位置每降低254 μm,外延炉温度整体升高10 ℃;异常PID 参数设置导致的升温曲线过冲,影响外延炉实际温度。实验数据量化了相关参数与外延炉温度变化的对应关系,为IC 外延产品的温度管控提供了依据,提升了单片硅外延平台的标准化和产业化水平。

关键词: 8 英寸IC 外延, 温度, 离子注入片

Abstract: Accurate temperature control is the key to IC epitaxy.Based on the 8-inch ion implanted wafer,the key factors affecting the temperature of single wafer epitaxial equipment were investigated.The experimental results indicated that the temperature at edge changed with ΔT by changing OFFSET parameter.However,the temperature at center and R/2 were not affected.When the central thermocouple installation position reduced 254 μm, the temperature of epitaxial equipment would increase 10 ℃.The overshoot of temperature curve,caused by the abnormal PID parameter setting,affected the actual temperature of the epitaxial equipment.The experimental data quantified the corresponding relationship between related factors and temperature of epitaxial equipment, provided the basis for temperature control of IC epitaxial products, and improved the construction level of single silicon wafer epitaxial standardization and industrialization platform.

Key words: 8-inch IC epitaxy, temperature, ion implanted wafer

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