关键词: 串行解串器, 自动测试设备, 可测性设计, 源同步

Abstract: Serial transmission technology, especially serializer and deserializer (SerDes), which can provide higher bandwidth than parallel transmission technology, is widely used in the field of embedded high-speed transmission. In view of the bandwidth of the test equipment required for the SerDes physical layer test is larger than the signal rate, and the test index is high and the access of the test port will affect the signal, while most manufacturers use the instrument and evaluation board to evaluate the device under test (DUT), which is inefficient and only applicable to the problem of the evaluation stage. This paper is based on auto test equipment (ATE) and design for test (DFT), by using the key technologies such as source synchronous test technology of high-speed serial interface, calibration and compensation of test path, and also comprehensively tests the functions, sending and receiving parameters of SerDes products, so as to realize fast and accurate test of high-speed interface. In addition, it can be applied to other similar SerDes chip tests.

Key words: serializer anddeserializer, auto test equipment, design for test, source synchronous