中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2021, Vol. 21 ›› Issue (11): 110401 . doi: 10.16257/j.cnki.1681-1070.2021.1106

• 微电子制造与可靠性 • 上一篇    下一篇

不同厚度GaAs通孔技术研究

闫未霞;彭挺;郭盼盼;强欢;莫中友;孔欣   

  1. 中国电子科技集团公司第二十九研究所,成都 610036
  • 收稿日期:2021-04-02 出版日期:2021-11-24 发布日期:2021-05-11

Research of the Backside Via-Hole forDifferent Thickness GaAs

YAN Weixia, PENG Ting, GUO Panpan, QIANG Huan, MO Zhongyou, KONG Xin   

  1. China ElectronicsTechnology Group Corporation No. 29 Institute,Chengdu 610036, China
  • Received:2021-04-02 Online:2021-11-24 Published:2021-05-11

摘要: 研究了不同厚度下砷化镓的通孔工艺。在以砷化镓为衬底的工艺加工中,背孔工艺是砷化镓的重要工艺,直接影响着器件的性能。首先阐述了目前砷化镓厚度为100 μm的工艺情况,分析了砷化镓厚度为150 μm时的深孔刻蚀。通过对刻蚀工艺中不同压强和不同偏置功率的研究,掌握砷化镓深度为200 μm的深孔刻蚀工艺。最后根据研究200 μm深孔刻蚀工艺的经验,开发深度为250 μm的深孔刻蚀工艺。

Abstract: Back via-hole technology with different thickness GaAs is researched. Back via-hole process plays an important role in process of GaAs as the substrate, which has directly effected on the performance of the device. Firstly, the via-hole process of GaAs with thickness of 100 μm is described. Secondly, the deep via-hole etching of GaAs with a thickness of 150 μm is analyzed. Then, through the study of different pressure and different bias power in the etching process, the deep hole etching process with the depth of 200 μm of GaAs is mastered. Finally, according to the process experience of 200 μm, a deep via-hole etching process with 250 μm thickness is developed.