中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2019, Vol. 19 ›› Issue (6): 012 -15. doi: 10.16257/j.cnki.1681-1070.2019.0604

• 电路设计 • 上一篇    下一篇

一种高速、高共模噪声抗扰的电平位移电路

张春奇,胡黎,潘溯,冯旭东,张宣,明鑫   

  1. 电子科技大学电子薄膜与集成器件国家重点实验室,成都 610054
  • 收稿日期:2019-02-27 出版日期:2019-06-19 发布日期:2019-06-19
  • 作者简介:张春奇(1993—),男,浙江湖州人,电子科技大学硕士研究生,从事模拟集成电路设计、电源管理设计与研究工作。

A High-Speed and High-Noise-Immunity Level Shifter for Gate Drive Circuit

ZHANG Chunqi,HU Li,PAN Su,FENG Xudong,ZHANG Xuan,MING Xin   

  1. State Key Laboratory of Electronic Thin Films and Integrated Devices,University of Electronic Science and Technology of China,Chengdu 610054,China
  • Received:2019-02-27 Online:2019-06-19 Published:2019-06-19

摘要: 介绍了一种应用于GaN 驱动的0.35 μm HV CMOS 工艺的高速、高共模噪声抗扰的电平位移电路。该电路采用高速电流镜和双锁存结构,并增加共模抗扰辅助电路,大大提高了传输速度和对共模噪声的抗扰能力。该高速、高共模噪声抗扰的电平位移电路主要用于驱动增强型GaN 的高压半桥栅驱动。仿真结果显示该电平位移电路上升沿传输延时1.03 ns,下降沿传输延时1.15 ns,可承受GaN 高压半桥栅驱动开关节点SW 处电压浮动50 V/ns。

关键词: 电平位移电路, 高速、高共模噪声抗扰, 增强型GaN, 高压半桥栅驱动

Abstract: A high-speed,highcommon-mode noise immunitylevel shiftingcircuit for a GaN-driver with 0.35 μm HV CMOS process is proposed.The level shift circuit uses a high-speed current mirror and dual latch structure,which greatly increases the transmission speed.At the same time,the common mode anti-interference auxiliary circuit is added to the circuit,so the anti-interference ability of the level shift circuit to the common mode noise is improved.The high-speed,high common mode noise immunity level shift circuit is mainly used to drive the high-voltage half-bridge drive of the enhanced GaN.The simulation results show that the level shift circuit has a rising edge transmission delay of 1.03 ns and a falling edge transmission delay of 1.15 ns,which can withstand the GaN high-voltage half-bridge gate drive SW node voltage floating 50 V/ns.

Key words: level shifter, high-speed and high-noise-immunity, enhanced GaN, high-voltage half-bridge drive

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