关键词: 误码率, 抖动, 概率密度函数, 确定性抖动, 随机抖动, 自动测试设备

Abstract: The popularization of high-speed serial interface brings new challenges to IC test. Bit error rate(BER) is a key index to measure the performance of communication system. Measuring the bit error rate of high-speed Serdes interface is very necessary. Usually, to test the bit error rate, a large amount of data needs to be sent to calculate the bit error rate with the number of error bits received by performance meter over a long period of time. The test not only needs a lot of time, but also needs to optimize the signal integrity in test path and other hardware to avoid the impact of itself on results. Starting from the mechanism of bit error rate, an efficient and reliable bit error rate test method is explored, and a jitter based mass production test scheme of bit error rate is proposed.

Key words: bit error rate, jitter, probability distribution function, data dependent jitter, random jitter, automatic test equipment