关键词: MCU芯片, 可测性设计, 测试资源复用, 测试成本, 测试方法

Abstract: With the complexity of customer requirements and the use of advanced EDA tools, MCU chips are developing towards high complexity, high integration and high performance, and the circuit scale is growing larger and larger, which makes the testability design of MCU more and more difficult. This paper first introduces the traditional test structure and its limitations, and then introduces the optimized test structure and test strategy. Finally, the test vector generation and overall test of CKS32F0XX are realized.

Key words: MCUchip, design-for-testability, testresourcereuse, testcost, testmethod