中国半导体行业协会封装分会会刊

中国电子学会电子制造与封装技术分会会刊

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电子与封装 ›› 2022, Vol. 22 ›› Issue (9): 090401 . doi: 10.16257/j.cnki.1681-1070.2022.0911

• 材料、器件与工艺 • 上一篇    下一篇

一种新型无电压折回现象的超结逆导型IGBT

吴 毅;夏 云;刘 超;陈万军   

  1. 电子科技大学电子薄膜与集成器件国家重点实验室,成都  610054
  • 收稿日期:2022-02-17 出版日期:2022-09-22 发布日期:2022-04-14
  • 作者简介:吴毅(1997—),男,重庆人,硕士研究生,主要研究方向为硅基功率器件。

NovelSuperjunctionReverseConducting IGBT Without Voltage Snapback Phenomenon

WU Yi, XIA Yun, LIU Chao, CHEN Wanjun   

  1. State Key Laboratoryof Electronic Thin Film and Integrated Device, University of Electronic Science and Technology of China, Chengdu 610054, China
  • Received:2022-02-17 Online:2022-09-22 Published:2022-04-14

摘要: 提出了一种新型无电压折回现象的超结逆导型绝缘栅双极型晶体管(RC-IGBT),并基于Sentaurus TCAD进行了电学特性仿真。提出的超结RC-IGBT通过超结的P柱将集电极N+区域与P+区域隔开,消除了传统超结RC-IGBT正向导通时存在的折回现象。与传统超结RC-IGBT结构相比,在导通电流密度为100 A/cm2时新结构的正向导通压降减少了20.9%,反向导通压降减少了20.7%,在相同正向导通压降(1.55 V)下新结构的关断损耗降低了19.9%。

关键词: 逆导, 超结, 电压折回, IGBT, 导通压降, 关断损耗

Abstract: A novel superjunction reverse conducting insulated gate bipolar transistor (RC-IGBT) without snapback phenomenon is proposed, and the electrical characteristics are simulated based on Sentaurus TCAD. The proposed superjunction RC-IGBT separates the collector N+ region from the P+ region through the P-pillar, which eliminates the snapback phenomenon existing in the forward conduction of the conventional superjunction RC-IGBT. Compared with the conventional superjunction RC-IGBT structure, the forward conduction voltage of the new structure is reduced 20.9% and the reverse conduction voltage of the new structure is reduced 20.7% when the conduction current density is 100 A/cm2, the turn-off loss of the new structure is reduced 19.9% under the same conduction voltage (1.55 V).

Key words: reverse conducting, superjunction, snapback, IGBT, conduction voltage, turn-off loss

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